IOE OpenIR  > 薄膜光学技术研究室(十一室)
光度法确定LaF_3薄膜光学常数
郭春; 林大伟; 张云洞; 李斌成
Source Publication光学学报
Volume31Issue:7Pages:276-282
2011
Language中文
Subtype期刊论文
Abstract为了满足设计和生产多层膜系时精确确定薄膜材料光学常数的需要,建立一种基于透射率光谱包络来获取弱吸收光学薄膜光学常数的均匀模型。为消除基底背面反射对光学薄膜光谱性能测量的影响,给出一种非破坏性的薄膜光学特性校正方法,校正实测光谱数据获得光学薄膜的单面光谱,并给出确定基底光学常数的方法。研究钼舟热蒸发工艺制备的沉积在CaF2基底上的LaF3薄膜样品,并获得了刚沉积的和紫外照射处理40 min后的LaF3薄膜以及CaF2基底在160~340 nm的光学常数。结果表明,紫外照射处理可以提高LaF3薄膜的光学特性(增...
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/6596
Collection薄膜光学技术研究室(十一室)
Corresponding Author郭春
Affiliation中国科学院光电技术研究所
Recommended Citation
GB/T 7714
郭春,林大伟,张云洞,等. 光度法确定LaF_3薄膜光学常数[J]. 光学学报,2011,31(7):276-282.
APA 郭春,林大伟,张云洞,&李斌成.(2011).光度法确定LaF_3薄膜光学常数.光学学报,31(7),276-282.
MLA 郭春,et al."光度法确定LaF_3薄膜光学常数".光学学报 31.7(2011):276-282.
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