中国科学院光电技术研究所机构知识库
Advanced  
IOE OpenIR  > 薄膜光学技术研究室(十一室)  > 期刊论文
题名:
Accurate determination of subnanoscale deformation with combined laser calorimetry and surface thermal lens technique
作者: Liu Mingqiang; Li Bincheng; Wang Yanru
刊名: Applied Physics Letters
出版日期: 2009
卷号: 94, 期号:13, 页码:131905
通讯作者: Liu Mingqiang
文章类型: 期刊论文
中文摘要: Laser-induced surface deformations of optical components are measured with a combined laser calorimetry (LC) and surface thermal lens (STL) technique. The deformation is calculated from the STL amplitude by employing a simple STL model. It is also directly calculated with a rigorous deformation model by measuring the absorptance of the optical component with LC. Experimentally, the laser-induced surface deformation values of a BK7 coating sample measured by STL and Hartmann wavefront sensing techniques are in excellent agreement with that calculated with the rigorous deformation model. The measurement of subnanometer deformation with the combined LC and STL technique is demonstrated by a fused silica coating sample. The deformation measurement sensitivity and error are estimated to be 10 pm and below 10percent, respectively.
英文摘要: Laser-induced surface deformations of optical components are measured with a combined laser calorimetry (LC) and surface thermal lens (STL) technique. The deformation is calculated from the STL amplitude by employing a simple STL model. It is also directly calculated with a rigorous deformation model by measuring the absorptance of the optical component with LC. Experimentally, the laser-induced surface deformation values of a BK7 coating sample measured by STL and Hartmann wavefront sensing techniques are in excellent agreement with that calculated with the rigorous deformation model. The measurement of subnanometer deformation with the combined LC and STL technique is demonstrated by a fused silica coating sample. The deformation measurement sensitivity and error are estimated to be 10 pm and below 10percent, respectively.
收录类别: SCI ; Ei
语种: 英语
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/6565
Appears in Collections:薄膜光学技术研究室(十一室)_期刊论文

Files in This Item:
File Name/ File Size Content Type Version Access License
2009-207.pdf(252KB)期刊论文作者接受稿开放获取View 联系获取全文

作者单位: 中国科学院光电技术研究所

Recommended Citation:
Liu Mingqiang,Li Bincheng,Wang Yanru. Accurate determination of subnanoscale deformation with combined laser calorimetry and surface thermal lens technique[J]. Applied Physics Letters,2009,94(13):131905.
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[Liu Mingqiang]'s Articles
[Li Bincheng]'s Articles
[Wang Yanru]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[Liu Mingqiang]‘s Articles
[Li Bincheng]‘s Articles
[Wang Yanru]‘s Articles
Related Copyright Policies
Null
Social Bookmarking
Add to CiteULike Add to Connotea Add to Del.icio.us Add to Digg Add to Reddit
文件名: 2009-207.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 
评注功能仅针对注册用户开放,请您登录
您对该条目有什么异议,请填写以下表单,管理员会尽快联系您。
内 容:
Email:  *
单位:
验证码:   刷新
您在IR的使用过程中有什么好的想法或者建议可以反馈给我们。
标 题:
 *
内 容:
Email:  *
验证码:   刷新

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.

 

 

Valid XHTML 1.0!
Copyright © 2007-2016  中国科学院光电技术研究所 - Feedback
Powered by CSpace