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题名:
Retrace error reconstruction based on point characteristic function
作者: He Yiwei1,2; Hou, Xi1; Quan Haiyang1,2; Song, Weihong1
刊名: OPTICS EXPRESS
出版日期: 2015-11-02
卷号: 23, 期号:22
DOI: 10.1364/OE.23.028216
文章类型: Article
英文摘要: Figure measuring interferometers generally work in the null condition, i.e., the reference rays share the same optical path with the test rays through the imaging system. In this case, except field distortion error, effect of other aberrations cancels out and doesn't result in measureable systematic error. However, for spatial carrier interferometry and non-null aspheric test cases, null condition cannot be achieved typically, and there is excessive measurement error that is referenced as retrace error. Previous studies about retrace error can be generally distinguished into two categories: one based on 4th-order aberration formalism, the other based on ray tracing through interferometer model. In this paper, point characteristic function (PCF) is used to analyze retrace error in a Fizeau interferometer working in high spatial carrier condition. We present the process of reconstructing retrace error with and without element error in detail. Our results are in contrast with those obtained by ray tracing through interferometer model. The small difference between them (less than 3%) shows that our method is effective. (C) 2015 Optical Society of America
WOS标题词: Science & Technology ; Physical Sciences
类目[WOS]: Optics
研究领域[WOS]: Optics
关键词[WOS]: INTERFEROMETRY ; CALIBRATION ; SURFACES
收录类别: SCI
语种: 英语
WOS记录号: WOS:000366578900012
ISSN号: 1094-4087
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/3784
Appears in Collections:光电技术研究所被WoS收录文章_期刊论文

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作者单位: 1.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Sichuan, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100039, Peoples R China

Recommended Citation:
He Yiwei,Hou, Xi,Quan Haiyang,et al. Retrace error reconstruction based on point characteristic function[J]. OPTICS EXPRESS,2015,23(22).
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