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题名:
Nonlinear optical properties of the lanthanum-modified lead zirconate titanate ferroelectric thin films using Z-scan technique
作者: Leng, Wenjian; Yang, Chuanren; Zhang, Jihua; Chen, Hongwei; Hui, Wencheng; Ji, Hong; Tang, Jinlong; Qin, Wenfeng; Li, Junjian; Lin, Hui; Ga, Lifeng
刊名: JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
出版日期: 2007
卷号: 46, 期号:1-3, 页码:L7-L9
关键词: (Pb,La)(Zr,Ti)O-3 ; rf magnetron sputtering ; nonlinear optical properties ; Z-scan technique
文章类型: Article
英文摘要: Lanthanum-modified lead zirconate titanate (Pb,La)(Zr,Ti)O-3 (PLZT) ferroelectric thin films with perovskite structure were fabricated on quartz substrates by rf magnetron sputtering at 650 degrees C. Their optical fundamental constants (the band gap, linear refractive index, and absorption coefficient) were obtained through optical transmittance measurements with the envelope method. The nonlinear optical proper-ties of the PLZT films were investigated by the Z-scan technique. The films display strong nonlinear optical effects. A negative nonlinear refractive index n(2) is determined to be 1.21 x 10(-6) esu in the films. These results show that the PLZT ferroelectric thin films are promising materials for nonlinear optics.
WOS标题词: Science & Technology ; Physical Sciences
类目[WOS]: Physics, Applied
研究领域[WOS]: Physics
关键词[WOS]: PULSED-LASER DEPOSITION ; COMPOSITE FILMS ; SINGLE-BEAM ; FEMTOSECOND ; CONSTANTS ; THICKNESS ; SILICON
收录类别: SCI
语种: 英语
WOS记录号: WOS:000244128000003
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/3559
Appears in Collections:光电技术研究所被WoS收录文章_期刊论文

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作者单位: 1.Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
2.Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Peoples R China
3.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China

Recommended Citation:
Leng, Wenjian,Yang, Chuanren,Zhang, Jihua,et al. Nonlinear optical properties of the lanthanum-modified lead zirconate titanate ferroelectric thin films using Z-scan technique[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS,2007,46(1-3):L7-L9.
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