中国科学院光电技术研究所机构知识库
Advanced  
IOE OpenIR  > 光电技术研究所被WoS收录文章  > 期刊论文
题名:
Geometrical characterization issues of plasmonic nanostructures with depth-tuned grooves for beam shaping
作者: Fu, Yongqi; Zhou, Wei; Lim, Lennie E. N.; Du, Chunlei; Luo, Xiangang; Zhao, Zeyu; Dong, Xiaochun; Shi, Haofei; Wang, ChangTao
刊名: OPTICAL ENGINEERING
出版日期: 2006-10-01
卷号: 45, 期号:10
关键词: surface plasmons ; metal film ; nanostructure ; beam shaping
文章类型: Article
英文摘要: Design of an enhanced surface plasmon polaritons (SPPs) based nanostructure for the purpose of beam shaping is discussed. An indentation with depth-tuned grooves is presented to realize the beam shaping and extraordinary transmission. The nanostructure is directly fabricated using focused ion beam (FIB) milling on an Ag thin film coated on quartz with a thickness of 200 nm. A large measurement error is found during geometrical characterization of the nanostructures by use of an atomic force microscope (AFM) working in tapping mode. Apex wearing and 34 deg full cone angle of the probe generate the measurement errors during the characterization of nanostructures with a feature size of 200 nm and below. To solve this problem, an FIB trimmed AFM probe is employed in the geometrical characterization. The results show that the error is improved greatly using the trimmed probe. The desired excitation of the SPPs is derived using an optical fiber coupled CCD spectrometer after the modified geometrical characterization. The designed structure can be used as an optical probe for future inspection and detection use. (c) 2006 Society of Photo-Optical Instrumentation Engineers.
WOS标题词: Science & Technology ; Physical Sciences
类目[WOS]: Optics
研究领域[WOS]: Optics
关键词[WOS]: SUBWAVELENGTH APERTURE ; OPTICAL-TRANSMISSION ; LIGHT
收录类别: SCI
语种: 英语
WOS记录号: WOS:000242527500042
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/3537
Appears in Collections:光电技术研究所被WoS收录文章_期刊论文

Files in This Item:

There are no files associated with this item.


作者单位: 1.Nanyang Technol Univ, Sch Mech & Aerosp Engn, Precis Engn & Nanotechnol Ctr, Singapore 639798, Singapore
2.Chinese Acad Sci, State Key Lab Opt Technol Microfabricat, Inst Opt & Elect, Chengdu 610209, Peoples R China

Recommended Citation:
Fu, Yongqi,Zhou, Wei,Lim, Lennie E. N.,et al. Geometrical characterization issues of plasmonic nanostructures with depth-tuned grooves for beam shaping[J]. OPTICAL ENGINEERING,2006,45(10).
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[Fu, Yongqi]'s Articles
[Zhou, Wei]'s Articles
[Lim, Lennie E. N.]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[Fu, Yongqi]‘s Articles
[Zhou, Wei]‘s Articles
[Lim, Lennie E. N.]‘s Articles
Related Copyright Policies
Null
Social Bookmarking
Add to CiteULike Add to Connotea Add to Del.icio.us Add to Digg Add to Reddit
所有评论 (0)
暂无评论
 
评注功能仅针对注册用户开放,请您登录
您对该条目有什么异议,请填写以下表单,管理员会尽快联系您。
内 容:
Email:  *
单位:
验证码:   刷新
您在IR的使用过程中有什么好的想法或者建议可以反馈给我们。
标 题:
 *
内 容:
Email:  *
验证码:   刷新

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.

 

 

Valid XHTML 1.0!
Copyright © 2007-2016  中国科学院光电技术研究所 - Feedback
Powered by CSpace