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题名:
Modeling and experimental verification of optical materials formed by stacked nanostrips
作者: Wei, Xingzhan1; Shi, Haofei1; Zheng, Guoxing2; Dong, Xiaochun1; Du, Chunlei1
刊名: OPTICS EXPRESS
出版日期: 2010-07-05
卷号: 18, 期号:14, 页码:14842-14849
文章类型: Article
英文摘要: The effective plasma frequency f(p) of periodic metallic wires whose characteristic dimensions are comparable to their skin depth has been analyzed. And a relevant analytic model is constructed by considering the skin effect and making a reasonable shape approximation, which is suitable for the case that the cross section of the wire is noncircular. To verify this model, a wires array with rectangle cross section is designed and the corresponding stacked Au-SiO2 nanostrips are fabricated. The experimental and simulational transmittances of the metamaterial have been evaluated with a good agreement, although the presence of quartz substrate and structural imperfections in experiment will have an impact, which validates that the multilayer Au-SiO2 nanostrips could function similarly to a natural bulk metal with discrepancies of f(p) values less than 8%. It could be confirmed that the theoretic formula is trustworthy in predicting f(p) for designing and realizing a controllable artificial metal in optical region. (C) 2010 Optical Society of America
WOS标题词: Science & Technology ; Physical Sciences
类目[WOS]: Optics
研究领域[WOS]: Optics
关键词[WOS]: LOW-FREQUENCY PLASMONS ; NEGATIVE-INDEX ; METAMATERIALS ; REFRACTION ; SUPERLENS ; LIGHT
收录类别: SCI
语种: 英语
WOS记录号: WOS:000279639900057
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/3360
Appears in Collections:光电技术研究所被WoS收录文章_期刊论文

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作者单位: 1.Chinese Acad Sci, State Key Lab Opt Technol Microfabricat, Inst Opt & Elect, Chengdu 610209, Peoples R China
2.Wuhan Univ, Sch Elect Informat, Wuhan 430079, Peoples R China

Recommended Citation:
Wei, Xingzhan,Shi, Haofei,Zheng, Guoxing,et al. Modeling and experimental verification of optical materials formed by stacked nanostrips[J]. OPTICS EXPRESS,2010,18(14):14842-14849.
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