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题名:
Negative and Positive Impact of Roughness and Loss on Subwavelength Imaging for Superlens Structures
作者: Guo, Zhen1,2; Huang, Qizhao2,3; Wang, Changtao2; Gao, Ping2; Zhang, Wei2; Zhao, Zeyu2; Yan, Lianshan1; Luo, Xiangang2
刊名: PLASMONICS
出版日期: 2014-02-01
卷号: 9, 期号:1, 页码:103-110
关键词: Subwavelength structures ; Surface roughness ; Loss ; Multilayer
文章类型: Article
英文摘要: We study on the negative and positive effect of surface roughness and loss coefficient on subwavelength imaging of the superlens structure. It has been found that even though surface roughness enables more transmission of high spatial frequency components, the random interferential noise between neighborhood images becomes more severe with increasing distortion. We show that additional loss is able to restrain the interferential noise caused by random roughness while preserving the imaging integrity. The results with practical parameters prove that the mean contrast and uniformity are improved by adding adequate loss on rough surface. Moreover, other two situations are further studied: (a) a single superlens with roughness on different interfaces and (b) a multilayered alternated metal-dielectric superlens with roughness on each surface. We found that the roughness on the imaging surface (metal-photoresist interface) plays a major role in determining the superlens imaging. The multilayer superlens is able to enhance the subwavelength imaging with fractionalized thinner films. But with the further fractionizing layers, the multilayer becomes more vulnerable to the roughness due to the multiple mixing and distorting. We still prove that additional loss is able to improve the performance in both situations.
WOS标题词: Science & Technology ; Physical Sciences ; Technology
类目[WOS]: Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary
研究领域[WOS]: Chemistry ; Science & Technology - Other Topics ; Materials Science
关键词[WOS]: OPTICAL HYPERLENS ; FIELD ; ENHANCEMENT ; SURFACE ; LENS
收录类别: SCI
语种: 英语
WOS记录号: WOS:000330995700012
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/2461
Appears in Collections:光电技术研究所被WoS收录文章_期刊论文

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作者单位: 1.Southwest Jiaotong Univ, Ctr Informat Photon Commun, Chengdu 610031, Peoples R China
2.Chinese Acad Sci, Inst Opt & Elect, State Key Lab Opt Technol Microfabricat, Chengdu 610209, Peoples R China
3.Univ Elect & Sci Technol China, Sch Mechatron Engn, Chengdu 611731, Peoples R China

Recommended Citation:
Guo, Zhen,Huang, Qizhao,Wang, Changtao,et al. Negative and Positive Impact of Roughness and Loss on Subwavelength Imaging for Superlens Structures[J]. PLASMONICS,2014,9(1):103-110.
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