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调制自由载流子吸收测量半导体载流子输运参数的三维理论
张希仁; 李斌成; 刘显明
Source Publication物理学报
Volume57Issue:11Pages:7310-7316
2008
Language中文
ISSN1000-3290
Indexed BySCI
Subtype期刊论文
Abstract推导出用于测量半导体载流子输运特性(载流子寿命、载流子扩散系数和前表面复合速度)的调制自由载流子吸收(modulatedfree carrier absorption,MFCA)检测技术的三维理论模型,给出了调制自由载流子吸收检测信号与调制频率和抽运-探测光相对距离的关系.定性分析了在不同调制频率时各个载流子输运参数对径向位置扫描曲线(信号与两束光相对距离的关系)的影响,结果表明调制自由载流子吸收检测信号对各个参数的灵敏度随抽运-探测光相对距离的增加而增加.仿真和实验结果表明,通过拟合不同调制频率时调制自由载流子吸收信号的径向位置扫描曲线能精确确定半导体材料的载流子输运特性.
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/2087
Collection薄膜光学技术研究室(十一室)
Recommended Citation
GB/T 7714
张希仁,李斌成,刘显明. 调制自由载流子吸收测量半导体载流子输运参数的三维理论[J]. 物理学报,2008,57(11):7310-7316.
APA 张希仁,李斌成,&刘显明.(2008).调制自由载流子吸收测量半导体载流子输运参数的三维理论.物理学报,57(11),7310-7316.
MLA 张希仁,et al."调制自由载流子吸收测量半导体载流子输运参数的三维理论".物理学报 57.11(2008):7310-7316.
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