Subwavelength imaging can be obtained with alternately layered metallodielectric films structure, even when the permittivity of metal and dielectric are not matched. This occurs as the effective transversal permittivity tends to be zero or the vertical on
英文摘要:
Subwavelength imaging can be obtained with alternately layered metallodielectric films structure, even when the permittivity of metal and dielectric are not matched. This occurs as the effective transversal permittivity tends to be zero or the vertical one approaches infinity, depending on the permittivity value of the utilized dielectric and metal material. Evanescent waves can be amplified through the structure, but not in a manner of fully compensating the exponentially decaying property in dielectric. Numerical illustration of subwavelength imaging is presented for variant configuration of anisotropic permittivity with finite layer number of metallodielectric films. (c) 2008 Optical Society of America.
WOS标题词:
Science & Technology
; Physical Sciences
类目[WOS]:
Optics
研究领域[WOS]:
Optics
关键词[WOS]:
NEGATIVE REFRACTION
; OPTICAL HYPERLENS
; SUPERLENS
; FIELD
