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题名:
Testing large aspheric surfaces with complementary annular subaperture interferometric method
作者: Xi Hou, Fan Wu, Baiping Lei, Bin Fan, Qiang Chen
出版日期: 2008
会议名称: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
学科分类: 先进光学加工与检测技术
中文摘要: A neural network model for representing the surface shape of stressed-lap was developed to facilitate a computer controlled optical polishing process. The dynamic change of the surface shape of the stressed lap during the operating process of polishing a large and highly aspheric optical surface is investigated. The original data from the micro displacement sensor matrix were used to train the neural network model. The experiment showed that the proposed model can represent the surface shape of the stressed-lap accurately.
收录类别: Ei
语种: 英语
卷号: 7018,VOLS 1-23
文章类型: 会议论文
页码: 5622-5626
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/1858
Appears in Collections:先光中心_会议论文

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Recommended Citation:
Xi Hou, Fan Wu, Baiping Lei, Bin Fan, Qiang Chen. Testing large aspheric surfaces with complementary annular subaperture interferometric method[C]. 见:PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE).
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文件名: 2008-257.pdf
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