IOE OpenIR  > 薄膜光学技术研究室(十一室)
Photothermal detuning: a sensitive technique for absorption measurement of optical thin films - art. no. 67201D
Hao, HG; Li, BC; Liu, MQ; et al.
Volume6720
PagesD7201-D7201
2008
Language英语
ISSN0361-0754
Indexed ByEi
Subtype会议论文
AbstractA simple and sensitive photothermal technique -photothermal detuning (PTDT), which is based on the absorption-induced shift of reflectance or transmission spectrum of an optical coating, is developed to measure the absorption of coated optical components. A PTDT theory is developed to describe the signal's dependence on the structural parameters of the optical coatings and on the geometric parameters of the experimental configuration. An experiment is performed to measure the PTDT signal of a highly reflective multilayer coating used in 532nm by using a probe beam with a wavelength of 632.8nm. By optimizing the incident angle of the probe beam, the measurement sensitivity is maximized. Good agreements between the theoretical predictions and experimental results are obtained.
Conference NamePROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Document Type会议论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/1855
Collection薄膜光学技术研究室(十一室)
Recommended Citation
GB/T 7714
Hao, HG,Li, BC,Liu, MQ,et al. Photothermal detuning: a sensitive technique for absorption measurement of optical thin films - art. no. 67201D[C],2008:D7201-D7201.
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