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题名:
Photothermal detuning: a sensitive technique for absorption measurement of optical thin films - art. no. 67201D
作者: Hao, HG ; Li, BC ; Liu, MQ ; et al.
出版日期: 2008
会议名称: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
学科分类: 光学薄膜技术
中文摘要: A simple and sensitive photothermal technique -photothermal detuning (PTDT), which is based on the absorption-induced shift of reflectance or transmission spectrum of an optical coating, is developed to measure the absorption of coated optical components. A PTDT theory is developed to describe the signal's dependence on the structural parameters of the optical coatings and on the geometric parameters of the experimental configuration. An experiment is performed to measure the PTDT signal of a highly reflective multilayer coating used in 532nm by using a probe beam with a wavelength of 632.8nm. By optimizing the incident angle of the probe beam, the measurement sensitivity is maximized. Good agreements between the theoretical predictions and experimental results are obtained.
收录类别: Ei
语种: 英语
卷号: 6720
ISSN号: 0361-0754
文章类型: 会议论文
页码: D7201-D7201
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/1855
Appears in Collections:薄膜光学技术研究室(十一室)_会议论文

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Recommended Citation:
Hao, HG,Li, BC,Liu, MQ,et al. Photothermal detuning: a sensitive technique for absorption measurement of optical thin films - art. no. 67201D[C]. 见:PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE).
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文件名: 2008-186.pdf
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