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题名:
Resolution enhancement of photon sieve based on apodization
作者: Cheng, GX ; Xing, TW ; Liao, ZJ ; et al.
出版日期: 2008
会议名称: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
中文摘要: Photon sieve is a novel diffractive optical element modulating either amplitude or phase which consists of a great number of pinholes distributed appropriately over the Fresnel zones for the focusing and imaging of light. Photon sieve has the advantages of the diameter of pinholes beyond the limitation of the corresponding Fresnel zone width and the minimum background in the focal plane. Furthermore, photon sieve can be fabricated on a single surface without any supporting struts required unlike the Fresnel zone plate. Photon sieve can be used as EUV telescope for solar orbiter, space-based surveillance telescope operating at visible light, or other imaging components. Photon sieve can also be used as one of the promising lithographic tools for nanoscale science and engineering to obtain the lower cost, higher flexibility and better resolution. The approaches to enhancing imaging resolution of photon sieve are presented in detail. According to Fresnel-Kirchhoff diffraction theory, the diffractive field of photon sieve is described by means of the discrete fast Fourier transform algorithm. The related contents include the calculation of point spread function, the suppression of side lobes, the imaging bandwidth, the physical limit of resolution, and the diffraction efficiency. Imaging properties of photon sieve are analyzed on the basis of precise test.
收录类别: Ei
语种: 中文
卷号: 6832
ISSN号: 0361-0751
文章类型: 会议论文
页码: 83229-83229
内容类型: 会议论文
URI标识: http://ir.ioe.ac.cn/handle/181551/1801
Appears in Collections:应用光学研究室(二室)_会议论文

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Recommended Citation:
Cheng, GX,Xing, TW,Liao, ZJ,et al. Resolution enhancement of photon sieve based on apodization[C]. 见:PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE).
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文件名: 2008-075.pdf
格式: Adobe PDF
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