IOE OpenIR  > 薄膜光学技术研究室(十一室)
Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement
Gong, Y; Li, BC
Source PublicationProceeding of SPIE
Volume6723Pages:672356
2007
Language英语
Indexed ByEi
Subtype期刊论文
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/1773
Collection薄膜光学技术研究室(十一室)
Corresponding AuthorGong, Y
Recommended Citation
GB/T 7714
Gong, Y,Li, BC. Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement[J]. Proceeding of SPIE,2007,6723:672356.
APA Gong, Y,&Li, BC.(2007).Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement.Proceeding of SPIE,6723,672356.
MLA Gong, Y,et al."Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement".Proceeding of SPIE 6723(2007):672356.
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