| Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement | |
| Gong, Y; Li, BC | |
| Source Publication | Proceeding of SPIE
 |
| Volume | 6723Pages:672356 |
| 2007 | |
| Language | 英语 |
| Indexed By | Ei |
| Subtype | 期刊论文 |
| Document Type | 期刊论文 |
| Identifier | http://ir.ioe.ac.cn/handle/181551/1773 |
| Collection | 薄膜光学技术研究室（十一室） |
| Corresponding Author | Gong, Y |
| Recommended Citation GB/T 7714 | Gong, Y,Li, BC. Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement[J]. Proceeding of SPIE,2007,6723:672356. |
| APA | Gong, Y,&Li, BC.(2007).Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement.Proceeding of SPIE,6723,672356. |
| MLA | Gong, Y,et al."Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement".Proceeding of SPIE 6723(2007):672356. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 7185.pdf（287KB） | 开放获取 | CC BY-NC-ND | View Application Full Text | |||
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