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Electronic transport characterization of silicon wafers by laterally resolved free-carrie
Zhang XR(张希仁)
Source PublicationAppl.Phys.Lett.
Volume89Issue:11Pages:~
2006
Language英语
Indexed BySCI
Subtype期刊论文
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/1522
Collection薄膜光学技术研究室(十一室)
Corresponding AuthorZhang XR(张希仁)
Recommended Citation
GB/T 7714
Zhang XR. Electronic transport characterization of silicon wafers by laterally resolved free-carrie[J]. Appl.Phys.Lett.,2006,89(11):~.
APA 张希仁.(2006).Electronic transport characterization of silicon wafers by laterally resolved free-carrie.Appl.Phys.Lett.,89(11),~.
MLA 张希仁."Electronic transport characterization of silicon wafers by laterally resolved free-carrie".Appl.Phys.Lett. 89.11(2006):~.
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