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子孔径拼接干涉测试技术现状及发展趋势
侯溪; 伍凡; 杨力; 吴时彬; 陈强; 候溪
Source Publication光学与光电技术
Volume3Issue:3Pages:50-53
2005
Language中文
Indexed By其他
Subtype期刊论文
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/1271
Collection先光中心
Corresponding Author候溪
Recommended Citation
GB/T 7714
侯溪,伍凡,杨力,等. 子孔径拼接干涉测试技术现状及发展趋势[J]. 光学与光电技术,2005,3(3):50-53.
APA 侯溪,伍凡,杨力,吴时彬,陈强,&候溪.(2005).子孔径拼接干涉测试技术现状及发展趋势.光学与光电技术,3(3),50-53.
MLA 侯溪,et al."子孔径拼接干涉测试技术现状及发展趋势".光学与光电技术 3.3(2005):50-53.
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