中国科学院光电技术研究所机构知识库
Advanced  
IOE OpenIR  > 光电技术研究所被WoS收录文章  > 期刊论文
题名:
Error analysis of laser beam quality measured with CCD sensor and choice of the optimal threshold
作者: He, Yuanxing1,2,3; Li, Xinyang2,3
刊名: OPTICS AND LASER TECHNOLOGY
出版日期: 2013-02-01
卷号: 45, 页码:671-677
关键词: Beam quality ; CCD sensor ; Error analysis
文章类型: Article
英文摘要: Accurate measurement of beam quality is very important in different areas of laser applications. Take the far-field Gaussian spot as an example, the calculation error formulas of peak Strehl ratio and beam quality factor beta are derived in the present of various error sources, such as background photon noise, CCD pixel's non-ideal sampling, CCD dark voltage, read-out noise of CCD, signal photon noise and measurement window size. The calculation errors of laser beam quality changing with various error sources are presented in theory and the corresponding numerically simulated results are given. Theoretical and simulated results show that when the threshold is set at (N-B) over bar + sigma(B), with (N-B) over bar standing for average value of the error sources and sigma(B) standing for mean-square value of the fluctuation in error sources, the lowest calculating error of laser beam quality could be achieved. Crown Copyright (c) 2012 Published by Elsevier Ltd. All rights reserved.
WOS标题词: Science & Technology ; Physical Sciences
类目[WOS]: Optics ; Physics, Applied
研究领域[WOS]: Optics ; Physics
关键词[WOS]: NUMERICAL-ANALYSIS
收录类别: SCI
语种: 英语
WOS记录号: WOS:000310401800101
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/1223
Appears in Collections:光电技术研究所被WoS收录文章_期刊论文

Files in This Item:

There are no files associated with this item.


作者单位: 1.Natl Univ Def Technol, Coll Optoelect Sci & Engn, Changsha 410073, Hunan, Peoples R China
2.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Sichuan, Peoples R China
3.Chinese Acad Sci, Key Lab Adapt Opt, Chengdu 610209, Sichuan, Peoples R China

Recommended Citation:
He, Yuanxing,Li, Xinyang. Error analysis of laser beam quality measured with CCD sensor and choice of the optimal threshold[J]. OPTICS AND LASER TECHNOLOGY,2013,45:671-677.
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[He, Yuanxing]'s Articles
[Li, Xinyang]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[He, Yuanxing]‘s Articles
[Li, Xinyang]‘s Articles
Related Copyright Policies
Null
Social Bookmarking
Add to CiteULike Add to Connotea Add to Del.icio.us Add to Digg Add to Reddit
所有评论 (0)
暂无评论
 
评注功能仅针对注册用户开放,请您登录
您对该条目有什么异议,请填写以下表单,管理员会尽快联系您。
内 容:
Email:  *
单位:
验证码:   刷新
您在IR的使用过程中有什么好的想法或者建议可以反馈给我们。
标 题:
 *
内 容:
Email:  *
验证码:   刷新

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.

 

 

Valid XHTML 1.0!
Copyright © 2007-2016  中国科学院光电技术研究所 - Feedback
Powered by CSpace