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High density print circuit board line width measurement algorithm based on statistical process control theory
Zhang, Jing1; Ye, Yutang1; Xie, Yu1; Liu, Lin1; Chang, Yongxin1,2; Luo, Ying1; Qiu, Lianxiao3
Source PublicationOPTIK
Volume124Issue:20Pages:4472-4476
2013
Language英语
Indexed BySCI
WOS IDWOS:000325445100089
SubtypeArticle
AbstractThe high-density circuit board width detection algorithms are proposed. The detection algorithms include the pre-processing algorithm of measured image line width and the final detection algorithm. The noise suppression of morphological erosion operator based on partial differential equations (PDE) is presented. The mathematical statistical methods and clustering segmentation edge are utilized to measure the upper and lower line width of high-density circuit board with sub-pixel fit to improve detection accuracy. Experiments show that the algorithm can accurately measure the line width distance of circuit board. And measure system analysis results show that the measured data accord with the statistical process control theory and are significant for guiding practice. (C) 2013 Elsevier GmbH. All rights reserved.
KeywordHigh-density Circuit Board Line Width Measurement Morphological Erosion Operator Clustering Segmentation Measure System Analysis
WOS Research AreaOptics
WOS SubjectOptics
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/1151
Collection光电技术研究所被WoS收录文章
Affiliation1.Univ Elect Sci & Technol China, Optelectr Informat Sch, Chengdu 610054, Peoples R China
2.Chinese Acad Sci, Inst Optic & Elect, Chengdu 610209, Peoples R China
3.Huazhong Univ Sci & Technol, Sch Comp Sci & Technol, Wuhan 410074, Hubei, Peoples R China
Recommended Citation
GB/T 7714
Zhang, Jing,Ye, Yutang,Xie, Yu,et al. High density print circuit board line width measurement algorithm based on statistical process control theory[J]. OPTIK,2013,124(20):4472-4476.
APA Zhang, Jing.,Ye, Yutang.,Xie, Yu.,Liu, Lin.,Chang, Yongxin.,...&Qiu, Lianxiao.(2013).High density print circuit board line width measurement algorithm based on statistical process control theory.OPTIK,124(20),4472-4476.
MLA Zhang, Jing,et al."High density print circuit board line width measurement algorithm based on statistical process control theory".OPTIK 124.20(2013):4472-4476.
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