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题名:
High density print circuit board line width measurement algorithm based on statistical process control theory
作者: Zhang, Jing1; Ye, Yutang1; Xie, Yu1; Liu, Lin1; Chang, Yongxin1,2; Luo, Ying1; Qiu, Lianxiao3
刊名: OPTIK
出版日期: 2013
卷号: 124, 期号:20, 页码:4472-4476
关键词: High-density circuit board ; Line width measurement ; Morphological erosion operator ; Clustering segmentation ; Measure system analysis
文章类型: Article
英文摘要: The high-density circuit board width detection algorithms are proposed. The detection algorithms include the pre-processing algorithm of measured image line width and the final detection algorithm. The noise suppression of morphological erosion operator based on partial differential equations (PDE) is presented. The mathematical statistical methods and clustering segmentation edge are utilized to measure the upper and lower line width of high-density circuit board with sub-pixel fit to improve detection accuracy. Experiments show that the algorithm can accurately measure the line width distance of circuit board. And measure system analysis results show that the measured data accord with the statistical process control theory and are significant for guiding practice. (C) 2013 Elsevier GmbH. All rights reserved.
WOS标题词: Science & Technology ; Physical Sciences
类目[WOS]: Optics
研究领域[WOS]: Optics
收录类别: SCI
语种: 英语
WOS记录号: WOS:000325445100089
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.ioe.ac.cn/handle/181551/1151
Appears in Collections:光电技术研究所被WoS收录文章_期刊论文

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作者单位: 1.Univ Elect Sci & Technol China, Optelectr Informat Sch, Chengdu 610054, Peoples R China
2.Chinese Acad Sci, Inst Optic & Elect, Chengdu 610209, Peoples R China
3.Huazhong Univ Sci & Technol, Sch Comp Sci & Technol, Wuhan 410074, Hubei, Peoples R China

Recommended Citation:
Zhang, Jing,Ye, Yutang,Xie, Yu,et al. High density print circuit board line width measurement algorithm based on statistical process control theory[J]. OPTIK,2013,124(20):4472-4476.
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