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Far field observation and theoretical analyses of light directional imaging in metamaterial with stacked metal-dielectric films
Wang, Changtao1; Gao, Ping1; Tao, Xing1; Zhao, Zeyu1; Pu, Mingbo1; Chen, Po2; Luo, Xiangang1
Source PublicationAPPLIED PHYSICS LETTERS
Volume103Issue:3
2013-07-15
Language英语
Indexed BySCI
WOS IDWOS:000322146300036
SubtypeArticle
AbstractWe report experimental observation of directional imaging of evanescent waves in layered metal-dielectric metamaterial. The investigation is performed with Ag/SiO2 multilayers combined with nano-object featured by a silicon mask slit. Evanescent waves of directional imaging are transferred to far field by roughening the top Ag layer and observed with a microscope objective. Experimental results agree well with numerical simulations. In addition, directional imaging behavior dependences on geometrical parameters are further presented and show great deviations with effective medium theory in some cases. (C) 2013 AIP Publishing LLC.
WOS KeywordNEAR-FIELD
WOS Research AreaPhysics
WOS SubjectPhysics, Applied
Citation statistics
Cited Times:14[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ioe.ac.cn/handle/181551/1149
Collection光电技术研究所被WoS收录文章
Affiliation1.Chinese Acad Sci, Inst Opt & Elect, State Key Lab Opt Technol Nanofabricat & Microeng, Chengdu 610209, Peoples R China
2.Univ Wyoming, Dept Geol & Geophys, Laramie, WY 82071 USA
Recommended Citation
GB/T 7714
Wang, Changtao,Gao, Ping,Tao, Xing,et al. Far field observation and theoretical analyses of light directional imaging in metamaterial with stacked metal-dielectric films[J]. APPLIED PHYSICS LETTERS,2013,103(3).
APA Wang, Changtao.,Gao, Ping.,Tao, Xing.,Zhao, Zeyu.,Pu, Mingbo.,...&Luo, Xiangang.(2013).Far field observation and theoretical analyses of light directional imaging in metamaterial with stacked metal-dielectric films.APPLIED PHYSICS LETTERS,103(3).
MLA Wang, Changtao,et al."Far field observation and theoretical analyses of light directional imaging in metamaterial with stacked metal-dielectric films".APPLIED PHYSICS LETTERS 103.3(2013).
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